DNA translocation measurements in solid-state nanopores fabricated using helium-ion microscope

ORAL

Abstract

We report high-quality DNA translocation measurements in solid-state nanopores drilled in free-standing SiN membranes by using a helium-ion beam in a Zeiss helium-ion microscope (HIM). We show that the HIM nanopores have similar performance as the TEM-drilled pores.

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Authors

  • Liping Liu

    Southeast University (Nanjing, China) and Brown University

  • Wang Miao

    Brown University

  • Chuong Huynh

    Zeiss America

  • Quanjun Liu

    Southeast University, Nanjing, China

  • Xinsheng Ling

    Brown University