Infrared Kerr measurements in ferromagnetic silicon carbide

ORAL

Abstract

We measure the infrared (100-1000 meV) polar Kerr angle in ferromagnetic silicon carbide (SiC). The Kerr angle is sensitive to the Hall conductivity $\sigma _{xy}$ and measures the difference of optical responses for left and right circularly polarized light, which makes it a sensitive spectral probe for small changes in the symmetry of the system due to magnetic order. Both neutron-irradiated and Al-doped samples are studied in the 10-300K temperature range. This study provides new insights into the mechanisms by which non-magnetic impurities and defects can produce magnetic order. Strong frequency dependence and hysteresis are observed in the Kerr measurements. Work supported by NSF-DMR1006078.

Authors

  • A. Mukherjee

    Physics Dept., University at Buffalo, Buffalo, NY, SUNY Buffalo, Dept. of Physics, Physics Dept., University at Buffalo, SUNY

  • C.T. Ellis

    Physics Dept., University at Buffalo, Buffalo, NY, SUNY Buffalo, Dept. of Physics, Physics Dept., University at Buffalo, SUNY

  • N. Tesarova

    Physics Dept., University at Buffalo, Buffalo, NY, SUNY Buffalo, Dept. of Physics, Physics Dept., University at Buffalo, SUNY

  • J. Cerne

    Physics Dept., University at Buffalo, Buffalo, NY, SUNY Buffalo, Dept. of Physics, SUNY Buffalo, Physics Dept., University at Buffalo, SUNY

  • Yu Liu

    Institute of Physics, Chinese Academy of Sciences, China

  • Shunchong Wang

    Institute of Physics, Chinese Academy of Sciences, China

  • Gang Wang

    Institute of Physics, Chinese Academy of Sciences, China