Phase Determination for Intra-unit-cell Fourier Transform STM -- Picometer Registration of Zn Impurity States in Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+\delta}$

ORAL

Abstract

By studying the real and imaginary components of the Bragg peaks in Fourier transforms of electronic structure images, distinct types of intra-unit cell (IUC) symmetry breaking can be studied using SI-STM [Lawler \textit{et al.}, Nature \textbf{466} 347 (2010)]. However, establishing the precise r-space symmetry point of each unit cell is crucial in defining the phase for such analysis. Exemplary of this challenge is the high-T$_{c}$ superconductor Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+\delta }$ for which the Bi atoms in the surface BiO layer are observable, while it is the invisible Cu atoms that define the relevant CuO$_{2}$ unit-cell symmetry point. We demonstrate, by imaging with pm precision the electronic impurity states at individual Zn atoms substituted at Cu sites, that the phase established using the Bi lattice produces a $\sim $2{\%}(2$\pi)$ error relative to the Cu lattice. In this case, IUC C$_{4v}$ symmetry breaking in the CuO$_{2}$ plane can be determined reliably using the phase assignment from the BiO layer. Moreover, impurity atom substitution at the relevant symmetry site can be of general utility in phase determination for Bragg-peak Fourier analysis of IUC symmetry.

Authors

  • Ines Firmo

    Cornell University; Brookhaven National Lab

  • Mohammad Hamidian

    Cornell University; Brookhaven National Lab

  • Kazuhiro Fujita

    Cornell, Cornell University; Brookhaven National Lab, Cornell University

  • Sourin Mukhopadhyay

    Cornell University; Brookhaven National Lab, Cornell University

  • Joseph Orenstein

    University of California, Berkeley, UC Berkeley, LBNL, UC Berkeley and Lawrence Berkeley National Laboratory, Department of Physics, UC Berkeley; Materials Science Division, LBNL, University of California, Berkeley and Lawrence Livermore National Laboratory

  • Hiroshi Eisaki

    AIST, National Institute of Advanced Industrial Science and Technology, Japan, Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan, National Institute of Advanced Industrial and Science Technology, Institute of Advanced Industrial Science and Technology, Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and technology

  • Shin-ichi Uchida

    Tokyo University, University of Tokyo, Japan, University of Tokyo, Department of Physics, University of Tokyo

  • Michael Lawler

    Cornell University

  • Eun-Ah Kim

    Cornell University

  • J.C. Seamus Davis

    Cornell, BNL, St. Andrews Univ., Cornell University; Brookhaven National Lab; University of St. Andrews, Scotland; Kavli Institute, Cornell, Cornell University; Brookhaven National Lab; University of St. Andrews, Scotland; Kavli Institute at Cornell, CMPMS Department, Brookhaven National Laboratory, Upton, NY 11973, USA, Cornell University, Cornell University, Brookhaven National Lab