Polarization Mapping in Ferroelectric Polymer Thin Films by Pyroelectric Scanning Microscopy

ORAL

Abstract

High-resolution mapping of polarization distribution in P(VDF-TrFE) Langmuir-Blodgett film was carried out through pyroelectric scanning microscopy with a focused 405nm blue diode laser beam. A lateral resolution of 500 nm was achieved by modulating the laser power at high frequency. At frequencies above 1 MHz, the laser spot size, rather than the thermal diffusion, becomes the limiting factor in the lateral resolution. The experimental results were compared to computer models developed with the finite element method.

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Authors

  • Jingfeng Song

    Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0299, USA

  • Stephen Ducharme

    Department of Physics and Astronomy, University of Nebraska-Lincoln, Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0299, USA