Characterization of interfacial charge accumulation in ferroelectric BaTiO$_3$/manganite interfaces using atomic-resolution annular bright field imaging and electron energy-loss spectroscopy
ORAL
Abstract
–
Authors
-
Robert Klie
University of Illinois at Chicago, University of Illinois - Chicago
-
Qiao Qiao
University of Illinois at Chicago, University of Illinois - Chicago
-
Patrick Phillips
University of Illinois at Chicago, University of Illinois - Chicago
-
Hanghui Chen
Columbia University, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University, Department of Physics, Columbia University
-
Matthew Marshall
Yale University, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University
-
Fred Walker
Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University
-
Sohrab Ismail-Beigi
Applied Physics, Yale University, Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University
-
Charles Ahn
Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University