Characterization of interfacial charge accumulation in ferroelectric BaTiO$_3$/manganite interfaces using atomic-resolution annular bright field imaging and electron energy-loss spectroscopy

ORAL

Abstract

Interfaces in functional oxides have been the focus of many studies due to potential emergence of novel phases. In this study, we will focus on ferroelectric/manganite, more specifically the LaSrMnO$_3$/BaTiO$_3$ interfaces in single-crystal thin films grown on SrTiO$_3$. Using atomic-resolution annular bright field (ABF) imaging, as well as atomic-column resolved electron energy-loss spectroscopy in the aberration-corrected, cold-field emission gun JEOL ARM200CF, we will demonstrate that the interfacial accumulation/depletion of charges, depending on the orientation of the ferroelectric polarization, can be directly quantified. We find that the interfacial accumulation of electron/holes is screen within three unit-cells of LaSrMnO$_3$. Moreover, using ABF imaging, we will shows that the distortions of the oxygen sublattice can be directly quantify, in both the BaTiO$_3$ layer, as well as the interfacial LaSrMnO$_3$. Our experimental results imaging and spectroscopy results will be complemented by first-principles density functional theory calculations.

Authors

  • Robert Klie

    University of Illinois at Chicago, University of Illinois - Chicago

  • Qiao Qiao

    University of Illinois at Chicago, University of Illinois - Chicago

  • Patrick Phillips

    University of Illinois at Chicago, University of Illinois - Chicago

  • Hanghui Chen

    Columbia University, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University, Department of Physics, Columbia University

  • Matthew Marshall

    Yale University, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

  • Fred Walker

    Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

  • Sohrab Ismail-Beigi

    Applied Physics, Yale University, Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

  • Charles Ahn

    Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University