Coherent Diffraction Imaging of Device Nanostructures

We employ x-ray coherent diffraction imaging to map the lattice strain distribution, elastic properties and device responses to external stimuli such as magnetic and electric field in a host of device nanostructures. For the case isolated Ni (001) nanowire grown vertically on an amorphous SiO2 /Si substrate we utilize the retrieved projection of lattice distortion to predict the Young's Modulus of the wire based on the elasticity theory [1]. We also image for the first time, the evolution of magnetostriction in these wires in the presence of an external magnetic field. For extended ferroelectric thin films, we utilized the recently developed Bragg Ptychography [2] to image the evolution of ferroelectricity [3].\\[4pt] [1] E. Fohtung et al., Appl. Phys. Lett. 101, 033107 (2012).\\[0pt] [2] S. O. Hruszkewycz et al., Nano Lett. 12, 5148 (2012).\\[0pt] [3] E. Fohtung et al., in preparation (2012).