Sensitive bolometry using hot-electron thermoelectric effect in graphene devices
ORAL
Abstract
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Authors
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Xinghan Cai
Center for Nanophysics and Advanced Materials (CNAM)-University of Maryland (UMD)
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R.J. Suess
Inst. for Research in Electronics and Applied Physics (IREAP)-UMD, Inst. for Research in Electronics and Applied Physics (IREAP)-University of Maryland (UMD), Inst. for Research in Electronics and Applied Physics-UMD
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Andrei Sushkov
Department of Physics, University of Maryland (Physics-UMD), University of Maryland, CNAM and MRSEC, Department of Physics, University of Maryland, USA, CNAM-UMD
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Greg Jenkins
Department of Physics, University of Maryland (Physics-UMD), CNAM-UMD
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M.-H. Kim
Department of Physics, University of Maryland (Physics-UMD), CNAM-UMD, Center for Nanophysics and Advanced Materials(CNAM)-University of Maryland(UMD)
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Jun Yan
University of Massachusetts at Amhearst, Dept. of Physics, University of Mass.-Amherst
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H. Dennis Drew
CNAM and MRSEC, Department of Physics, University of Maryland, CNAM-UMD
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T. Murphy
IREAP-UMD, Inst. for Research in Electronics and Applied Physics-UMD
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Michael Fuhrer
Department of Physics, University of Maryland, University of Maryland, CNAM-UMD, Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742-4111, USA, Center for Nanophysics and Advanced Materials University of Maryland, College Park, Center for Nanophysics and Advanced Materials, University of Maryland, College Park