Unravelling the intrinsic and robust nature of van Hove singularities in twisted bilayer graphene

ORAL

Abstract

Extensive scanning microscopy and spectroscopy experiments completed by first principles and parameterized tight binding calculations provide a clear answer to the existence, origin and robustness of van Hove singularities in twisted grapheme layers. Our results are conclusive: vHs due to interlayer coupling are present in abroad range of rotation angles. From the variation of the energy separation of the vHs with rotation angle we recover the Fermi velocity of the grapheme monolayer as well as the strength of the interlayer interaction. The robustness of the vHs is assessed both by experiments and calculations which test the role of the periodic modulation and absolute value of the interlayer distance. We clarify the origin of the moir\'{e} corrugation observed in the STM images.

Authors

  • Felix Yndurain

    Dept. F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain

  • Iv\'an Brihuega

    Dept. F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain, Departamento de F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain

  • Pierre Mallet

    Institut N\'eel, CNRS-UJF, BP 166, F-38042 Grenoble, France

  • Hector Gonzalez-Herrero

    Dept. F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain

  • Guy Trambly de Laissardi\`ere

    Laboratoire de Physique Th\'eorique et Mod\'elisation, Universit\'e de Cergy-Pontoise-CNRS, F-95302 Cergy-Pontoise, France

  • Miguel Ugeda

    Dept. F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain

  • Jos\'e Mar\'Ia G\'omez-Rodr\'Iguez

    Dept. F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain, Departamento de F\'isica de la Materia Condensada, Universidad Aut\'onoma de Madrid, E-28049 Madrid, Spain

  • Laurence Magaud

    Institut N\'eel, CNRS-UJF, BP 166, F-38042 Grenoble, France

  • Jean Yves Veuillen

    Institut N\'eel, CNRS-UJF, BP 166, F-38042 Grenoble, France