\textit{In Situ} Electrical Biasing Studies of Magnetoelectric Coupling in La$_{1-x}$Sr$_{x}$MnO$_{3}$-PbZr$_{x}$Ti$_{1-x}$O$_{3}$ Thin Film Oxide Heterostructures
ORAL
Abstract
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Authors
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Steven Spurgeon
Drexel University, Department of Materials Science and Engineering
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Ian McDonald
Northeastern University, Department of Electrical and Computer Engineering
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Esther Huang
University of New South Wales, School of Materials Science and Engineering
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Rama Vasudevan
University of New South Wales, School of Materials Science and Engineering
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Samuel Lofland
Rowan University, Rowan University, Department of Physics and Astronomy
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Brian Kirby
National Institute of Standards and Technology, National Institute for Standard Technology, NIST, National Institute of Standards and Technology, Center for Neutron Research
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Nagarajan Valanoor
University of New South Wales, School of Materials Science and Engineering
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Mitra Taheri
Drexel University, Department of Materials Science and Engineering