Thin film NMR T$_{\mathrm{1}}$ measurement by MRFM using cyclic adiabatic inversion

We obtained the NMR spectrum and the spin lattice relaxation time (T$_{\mathrm{1}})$ for thin film samples using Magnetic Resonance Force Microscopy (MRFM). The samples were Alq$_{\mathrm{3}}$, which is widely used as an organic light emitting diode (OLED), thin films of 150 nm thick and a bulk crystal. T$_{\mathrm{1}}$ was measured by using the cyclic adiabatic inversion method at a fixed frequency of 297 MHz and at 12 K. To confirm the reliability of our measurement technique we compared the result with that obtained by conventional NMR method. T$_{\mathrm{1}}$ of thin film samples was measured and compared with that of the bulk sample.