Modulating the properties of thin film nickelates using a ferroelectric

ORAL

Abstract

Controlling materials properties using electric fields is an important approach to creating novel electronic materials. The perovskite oxides, which exhibit some of the most interesting phenomena found in the solid state, represent an ideal system for exploring how electric fields couple to material properties. As an example, the rare-earth nickelates (LaNiO$_{\mathrm{3}}$, NdNiO$_{\mathrm{3}}$, etc.) undergo a metal-insulator transition when the unit cell structure is changed by chemical doping or through the application of strain. Here we show that the polarization of the canonical ferroelectric PbZr$_{\mathrm{0.2}}$Ti$_{\mathrm{0.8}}$O$_{\mathrm{3\thinspace }}$couples to the structure and conductivity of the rare earth nickelates (RNiO$_{\mathrm{3}})$. As the polarization of the PZT is switched, we introduce atomic-scale structural distortions at the PZT-nickelate interface that modulate the carrier concentration in the nickelate. We find that interfacial effects dominate, resulting in a large change in the conductivity of the nickelate.

Authors

  • Matthew S. J. Marshall

    Department of Applied Physics and Center for Research on Interface Structures and Phenomena, Yale University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University

  • Andrei Malashevich

    Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University

  • Ankit S. Disa

    Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University

  • Hanghui Chen

    Department of Physics, Columbia University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University

  • Sohrab Ismail-Beigi

    Yale University, Department of Physics and Center for Research on Interface Structures and Phenomena, Yale University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University

  • Fred J. Walker

    Department of Applied Physics and Center for Research on Interface Structures and Phenomena, Yale University, Yale University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University

  • Charles Ahn

    Department of Physics and Center for Research on Interface Structures and Phenomena, Yale University, Yale University, Center for Research on Interface Structures and Phenomenon (CRISP), Yale University and Dept. of Applied Physics, Yale University, Center for Research on Interface Structures and Phenomena (CRISP), Yale University and Department of Applied Physics, Yale University