Invited Session: Industrial Physics Forum: Advances in Measurement Technology
FOCUS · M23
Presentations
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Advances in Measurement Technology at NIST's Physical Measurement Laboratory
COFFEE_KLATCH · Invited
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Authors
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Joseph Dehmer
National Institute of Standards and Technology
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Recent Advances in AFM Technology
COFFEE_KLATCH · Invited
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Authors
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Jason Cleveland
Asylum Research, an Oxford Instruments Company
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Metrology Tools for Semiconductor Manufacturing
COFFEE_KLATCH · Invited
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Authors
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Alain Diebold
SUNY College of Nanoscale Science and Engineering, State university at Albany, College of Nanoscale Science and Engineering
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Recent advances in medical ultrasound
COFFEE_KLATCH · Invited
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Authors
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Lawrence Crum
Center for Industrial and Medical Ultrasound, University of Washington
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High Sensitivity Gravity Measurements in the Adverse Environment of Oil Wells
COFFEE_KLATCH · Invited
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Authors
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Harold Pfutzner
Schlumberger
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