Silicene on Silver: fundamental physical properties and integration in Field-Effect Transistors
ORAL
Abstract
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Authors
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Eugenio Cinquanta
Laboratorio MDM, IMM-CNR, via C. Olivetti 2, Agrate Brianza, I-20864, Italy
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Li Tao
Microelectronics Research Center, The University of Texas at Austin, Texas 78758, USA
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Guido Fratesi
ETSF, CNISM, Dip. di Fisica, Universit\`{a} di Milano, Milano, Italy, and Dip. di Scienza dei Materiali, Milano-Bicocca, Milano, Italy, ETSF and Dipartimento di Fisica, Universit\`a degli Studi di Milano, Milano, Italy, ETSF, CNISM, Dip. di Fisica, Universit\`{a} di Milano, Via Celoria 16, I-20133 Milano, Italy, and Dip. di Scienza dei Materiali, Milano-Bicocca
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Carlo Grazianetti
Laboratorio MDM, IMM-CNR, via C. Olivetti 2, Agrate Brianza, I-20864, Italy
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Marco Fanciulli
Laboratorio MDM, IMM-CNR, via C. Olivetti 2, Agrate Brianza, I-20864, Italy
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Giovanni Onida
ETSF and Dipartimento di Fisica, Universit\`a degli Studi di Milano, Milano, Italy
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Deji Akinwande
Microelectronics Research Center, The University of Texas at Austin, Texas 78758, USA, The University of Texas at Austin, Univ of Texas, Austin, Department of Electrical and Computer Engineering, The University of Texas at Austin, TX 78712, UT Austin
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Alessandro Molle
Laboratorio MDM, IMM-CNR, via C. Olivetti 2, Agrate Brianza, I-20864, Italy, CNR-IMM, Laboratorio MDM