Revisiting length-dependent Raman spectroscopy of single-wall carbon nanotubes using single chirality, length-refined populations

ORAL

Abstract

As-synthesized, single-wall carbon nanotube (SWCNT) populations contain a wide variety of diameter and length nanotubes. This structural diversity with its accompanying property variation, especially in optical properties, provides a great challenge to application and characterization for these materials. Given the tremendous effort to understand the diameter-dependent optical properties of SWCNTs, it is perhaps surprising that little recent work has re-examined the consequences of length, a correspondingly important factor in terms of characterization, to our understanding of the science. Early work demonstrated that for SWCNTs of mixed chirality, the variation in length drove a degradation at short lengths in the optical responses. Since then, identification that morphological impurities and defect density were highly correlated with length in singly sorted samples prompted a reexamination of those results. In this work we probe the length-dependent optical properties of SWCNTs using extremely high-quality SWCNT populations based on multiple aqueous-two-phase separations followed by size exclusion chromatography length-separations. Our results reveal significant and varying dependencies on properties including the G peak intensity and D/G ratio as measured by resonant Raman spectroscopy with the length of single species SWCNT populations, and in other optical properties including absorption and fluorescence.

Authors

  • Yanmei Piao

    National Institute of Standards and Technology (NIST)

  • Stephanie Lam

    National Institute of Standards and Technology (NIST)

  • Angela Hight Walker

    National Institute of Standards and Technology, National Institute of Standards and Technology (NIST), Semiconductor and Dimensional Metrology Div, NIST, Gaithersburg, MD, National Institute of Standards and Technology, Gaithersburg, MD 20899, NIST

  • Jeffrey Fagan

    National Institute of Standards and Technology (NIST)