Time-resolved x-ray diffraction study of photoinduced strains in $h-LuFeO_{3}$ thin film

ORAL

Abstract

We have studied the structural response of epitaxially stabilized h-LuFeO3 (0001) thin film to above-band-gap optical excitation (pump) using time-resolved x-ray diffraction (probe) at picosecond time scale. The shift in (004) Bragg peak induced by a 390 nm excitation (30 ps duration) has been studied as a function of pump fluence and pump-probe time delay. The out-of-plane photoinduced lattice strain $(\Delta c/c)$ exhibits a non-linear relation with fluence. The relaxation time is on the order of 1 ns. These observations suggest a relaxation mechanism that may be mediated by combined effects of charge recombination and phonon relaxation.

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Authors

  • Kishan Sinha

    Department of Physics and Astronomy, University of Nebraska, Lincoln, Nebraska 68588, USA

  • Xuanyuan Jiang

    Department of Physics and Astronomy, University of Nebraska, Lincoln, Nebraska 68588, USA, University of Nebraska-Lincoln, Nebraska Center for Materials and Nanoscience

  • Xiao Wang

    Department of Physics, Bryn Mawr College, Bryn Mawr, Pennsylvania 19010, USA

  • Anthony DiChiara

    Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

  • Xuemei Cheng

    Department of Physics, Bryn Mawr College, Bryn Mawr, Pennsylvania 19010, USA

  • Y. Li

    Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA, Argonne National Lab

  • Xiaoshan Xu

    Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, Univerity of Nebraska,Lincoln, Nebraska 68588, USA