First Principles Study of Contact Resistance across Nickel-Treated-Graphene-MoS$_{2}$ Interfaces
ORAL
Abstract
Recently, Ni-treated-graphene electrodes were fabricated on MoS$_{2}$ using a dry transfer technique and metal-catalyzed graphene treatment process, yielding contact resistances as low as 200 $\Omega \mu $m and a substantial contact enhancement of $\sim$ 2 orders of magnitude relative to Ni-MoS$_{2}$ interfaces. By performing a Schottky barrier height (SBH) analysis on Ni-MoS$_{2}$ and Ni-graphene-MoS$_{2}$ interfaces using first-principles DFT calculations, we have found that the smaller contact resistance in Ni-treated-graphene-MoS$_{2}$ can be attributed to the smaller SBH of Ni-graphene-MoS$_{2}$ contacts. This reduction in SBH can in turn be related to the lower work function of Ni-graphene electrodes relative to Ni. The effect of Ni treatment further reduces the contact resistance due to stronger coupling between Ni and graphene edges.
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Authors
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W.S. Leong
Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583
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X. Luo
Department of Physics and Graphene Research Centre, National University of Singapore, Singapore 117543
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Y. Li
Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583
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K.H. Khoo
Department of Physics and Graphene Research Centre, National University of Singapore, Singapore 117543
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S.Y. Quek
Department of Physics and Graphene Research Centre, National University of Singapore, Singapore 117543
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John T.L. Thong
Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583