\textbf{Raman spectroscopy of exfoliated few-layered n-type Bi}$_{\mathrm{\mathbf{2}}}$\textbf{Te}$_{\mathrm{\mathbf{3}}}$

ORAL

Abstract

A novel chemical-exfoliation spark-plasma-sintering (CE-SPS) process was applied to enhance the thermoelectric figure of merit and compatibility factor of few-layered n-type Bi$_{\mathrm{2}}$Te$_{\mathrm{3}}$. New vibrational modes were observed in the micro-Raman spectra of the few-layered Bi$_{\mathrm{2}}$Te$_{\mathrm{3}}$ samples, which are absent in the bulk. Here we focus on the emergence of the new intermediate and high-frequency Raman modes and their dependence on the layer thickness. A detailed Raman study probing the origin of these exfoliation induced defect modes will be presented.

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Authors

  • Fengjiao Liu

    Clemson Nanomaterials Center, Department of Physics and Astronomy, Clemson University, Clemson, SC USA 29634

  • Mehmet Karakaya

    Clemson Nanomaterials Center, Department of Physics and Astronomy, Clemson University, Clemson, SC USA 29634, None

  • Pooja Puneet

    Clemson Nanomaterials Center, Department of Physics and Astronomy, Clemson University, Clemson, SC USA 29634

  • Ramakrishna Podila

    Laboratory of Nano-biophysics and COMSET, Clemson Nanomaterials Center, Dept. of Physics & Astronomy, Clemson University, Clemson, SC USA 29634

  • Sriparna Bhattacharya

    Clemson Nanomaterials Center, Department of Physics and Astronomy, Clemson University, Clemson, SC USA 29634

  • Apparao Rao

    Clemson Univeristy, Clemson Nanomaterials Center, Laboratory of Nano-biophysics and COMSET, Dept. of Physics and Astronomy, Clemson University, Clemson, SC USA 29634, Clemson Nanomaterials Center, Dept., of Physics and Astronomy, Clemson University, Clemson, Laboratory of Nano-biophysics and COMSET