Electronic and structural properties of epitaxial silicene on h-BN-terminated ZrB$_{\mathrm{2}}$
ORAL
Abstract
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Authors
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Frank Wiggers
MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands
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Antoine Fleurence
School of Materials Science, JAIST, Japan, Japan Advanced Institute of Science and Technology, School of Materials Science, Nomi, Ishikawa 923-1292, Japan, Japan Advanced Institute of Science and Technologies
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Kohei Aoyagi
Japan Advanced Institute of Science and Technology, School of Materials Science, Nomi, Ishikawa 923-1292, Japan
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Takahiro Yonezawa
Japan Advanced Institute of Science and Technology, School of Materials Science, Nomi, Ishikawa 923-1292, Japan
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Yukiko Yamada-Takamura
School of Materials Science, JAIST, Japan, Japan Advanced Institute of Science and Technology, School of Materials Science, Nomi, Ishikawa 923-1292, Japan, Japan Advanced Institute of Science and Technologies
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Haifeng Feng
Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, New South Wales 2525, Australia
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Jincheng Zhuang
Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, New South Wales 2525, Australia
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Yi Du
Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, New South Wales 2525, Australia
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Alexey Kovalgin
MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands
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Michel de Jong
MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands