Structural Characterization of Stanene Grown on Bi$_2$Te$_3$ by Anomalous X-Ray Scattering
ORAL
Abstract
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Authors
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Stephen Albright
Department of Physics, Yale University, Department of Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University, Yale University
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Ke Zou
Department of Applied Physics, Yale University, Department of Applied Physics and CRISP, Yale University, Dept. of Appl. Phys. and CRISP, Yale Univ., Yale University
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Rui Peng
Department of Applied Physics, Yale University, Department of Applied Physics and CRISP, Yale University
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Claudia Lau
Department of Physics and CRISP, Yale University, Yale University
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Hawoong Hong
Argonne National Laboratory, X-Ray Science Division, Argonne National Laboratory, Argonne National Lab
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Charles Ahn
Department of Applied Physics, Yale University, Yale Univ, Department of Applied Physics and CRISP, Yale University, Yale University
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Frederick Walker
Department of Applied Physics, Yale University, Yale Univ, Department of Applied Physics and CRISP, Yale University, Yale University