NIST's Polarized Resonant Soft X-ray Scattering facility to measure chemical structure and molecular orientation on the nano-scale

POSTER

Abstract

NIST is developing a new Polarized Resonant Soft X-ray Scattering (P-RSoXS) facility at the NSLS-II synchrotron located in Brookhaven National Laboratory. This facility will enable the highest quality ensemble measurements of the nanoscale distribution of molecular species and orientations in both high-throughput ex-situ measurements and diverse specialized in-situ experiments. The facility's current state of design will be presented, along with a survey of applications in fields from thin-film organic electronics, and biology to energy and environmental sciences. A dialog with the community regarding potential applications is encouraged.

Authors

  • Eliot Gann

    NIST - Natl Inst of Stds & Tech

  • Daniel Fischer

    NIST - Natl Inst of Stds & Tech

  • Dean DeLongchamp

    NIST - Natl Inst of Stds & Tech, NIST