Johnson noise thermometry of optically excited hot electrons in hBN encapsulated graphene
ORAL
Abstract
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Authors
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Dmitri Efetov
MIT
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Yuanda Gao
Columbia University
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Ren-Jye Shiue
MIT
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Evan D. Walsh
Massachusetts Institute of Technology, Raytheon BBN Technologies, Harvard University, MIT
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G. Grosso
MIT, Massachusetts Inst of Tech-MIT, Massachusetts Institute of Technology
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Cheng Peng
MIT
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Cheng Tan
Columbia University
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P. Kim
Harvard University, Department of Physics, Harvard University, Department of Physics, Harvard University, Cambridge, MA 02138, US, Harvard University, department of Physics, Harvard University, Department of Physics, Department of Physics, Harvard University, Cambridge, MA, 02138, Department of Physics, Harvard University, Cambridge, MA 02138
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James Hone
Columbia University, Columbia Univ, Department of Mechanical Engineering, Columbia University
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Kin Chung Fong
BBN Raytheon, Raytheon BBN Technologies, Quantum Information Processing Group, Cambridge, MA 02138, USA
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D. Englund
MIT, Massachusetts Inst of Tech-MIT, Massachusetts Institute of Technology