The Layer-Dependence on the Work Function and Degradation Evolution of Black Phosphorus

ORAL

Abstract

Black phosphorus (BP) has been received great attention due to the layer-electronic structure. This layer-dependent electronic structure of BP shows not only the variation of bandgap but also work function (WF) shift. These layer-dependent electronic properties at such interfaces are key parameters to determine interfacial properties, such as Schottky barrier and charge redistribution. Furthermore, the fast degradation of BP is currently a critical obstacle for an application. Since the degradation progress at the interface between BP and O2/H2O molecules in ambient condition, the layer-dependent electronic properties are key parameters to understood the degradation process of BP.
In this regards, we focused on the layer-dependent WF and its evolution of BP by scanning Kelvin probe microscope measurement in ambient condition. It shows that the WF of the bilayers increases by 0.12 eV than that of bulk. The layer-dependent work function of BP was discussed in detail by our first-principles calculations. In addition, the layer-dependent degradation behaviors were observed. These behaviors were understood by the oxidation kinetic model based on the Marcus-Gerischer theory.

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Presenters

  • Minju Kim

    Institute of Physics and Applied Physics, Yonsei University

Authors

  • Minju Kim

    Institute of Physics and Applied Physics, Yonsei University

  • Han-gyu Kim

    Department of Physics, Center for Computational Studies of Advanced Electronic Material Properties, Yonsei University, Institute of Physics and Applied Physics, Yonsei University

  • Soohyung Park

    Institute of Physics and Applied Physics, Yonsei University

  • Jin Sung Kim

    Institute of Physics and Applied Physics, Yonsei University

  • Hyoung Joon Choi

    Physics, Yonsei University, Department of Physics and Center for Computational Studies of Advanced Electronic Material Properties, Yonsei University, Physics, Yonsei Univ., Dept. of Physics, Yonsei University, Department of Physics, Yonsei University, Department of Physics, Center for Computational Studies of Advanced Electronic Material Properties, Yonsei University, Institute of Physics and Applied Physics, Yonsei University, Department of Physics, and Center for Computational Studies of Advanced Electronic Material Properties, Yonsei University

  • Seongil Im

    Dept. of Physics, Yonsei University, Institute of Physics and Applied Physics, Yonsei University

  • Hyunbok Lee

    Department of Physics, Kangwon National University

  • Taekyeong Kim

    Department of Physics, Hankuk University of Foreign Studies

  • Yeonjin Yi

    Institute of Physics and Applied Physics, Yonsei University