Soft matter structure measurement by Polarized Resonant Soft X-ray Scattering

In many applications of soft matter, the connection between structure and performance is complex, and conventional structure measurements are not sufficient to provide a predictive picture. Nanoscale variations in molecular orientation and composition, particularly in amorphous regions, are thought to be critical, but few techniques can probe them. I will describe our approach to polarized resonant soft X-ray scattering (P-RSoXS), which combines principles of spectroscopy, small-angle scattering, real-space imaging, and molecular simulation to produce a molecular scale structure measurement for soft materials and complex fluids. Progress and designs for a new P-RSOXS beamline will be shown. Results from model systems including commodity plastics, block copolymers, and organic photovoltaics blends will be discussed.