Test of Alternative Electrodynamic Theory of Superconductivity by using Ultra Low Temperature Scanning Probe Spectroscopy

ORAL

Abstract

One of the main assumptions of London’s theory of superconductivity is the screening of an electric field inside a conventional superconductor on a short length scale, on the order of the Thomas-Fermi length. According to the alternative electrodynamic theory of conventional superconductors proposed by Hirsch[1], the electric field inside the superconductor should have a much larger decay length, similar to London penetration of the magnetic field. To test this hypothesis, we measured the force vs distance curves between a metal probe tip and superconducting Al surface. We correlated the force curve with the superconducting tunneling spectra, in and out of the superconducting state of the Al sample. The measurements were performed in a mK STM system, which has been recently upgraded to include a quartz tuning fork sensor for AFM measurement capability. The Al film was grown by MBE onto graphene/SiC substrate and transferred in the mK STM in ultra-high vacuum with a base temperature of 10 mK. The Al film was brought into the normal state with the application of a magnetic field above its critical field limit. We describe the results and compare to similar experiments performed on Nb surface.[2]

[1] Hirsch, PRB, 69, 214515 (2004)
[2] Peronio and Giessibl, PRB, 94, 094503 (2016)

Presenters

  • Sungmin Kim

    Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, NIST

Authors

  • Sungmin Kim

    Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, NIST

  • Johannes Schwenk

    Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, NIST

  • Julian Berwanger

    Institut für Experimentelle und Angewandte Physik, Universität Regensburg

  • William Cullen

    Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, NIST

  • Steven Blankenship

    Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, NIST

  • Angelo Peronio

    Institut für Experimentelle und Angewandte Physik, Universität Regensburg

  • Young Kuk

    Dept. of Physics and Astronomy, Seoul National University, Department of Physics and Astronomy, Seoul National University

  • Franz Giessibl

    Institut für Experimentelle und Angewandte Physik, Universität Regensburg

  • Joseph Stroscio

    Center for Nanoscale Science and Technology, NIST, Center for Nanoscale Science and Technology, NIST -Natl Inst of Stds & Tech, NIST -Natl Inst of Stds & Tech, Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, National Institute of Standards and Technology, NIST