Air-Stable Room-Temperature Mid-Infrared Photodetectors Based on hBN/Black Arsenic Phosphorus/hBN Heterostructures

ORAL

Abstract

Recently, layered black phosphorus (BP) has been explored intensively for infrared optoelectronic applications due to its high carrier mobility and the moderate direct bandgap (about 0.33 electron volt) in the thin film form. In this work, we demonstrate mid-infrared photodetectors based on black arsenic phosphorus (b-AsxP1-x), whose bandgap can be below 0.15 electron volt by the introduction of arsenic. Mid-infrared photodetectors have been demonstrated leveraging the hexagonal boron nitride (hBN)/b-As0.83P0.17/hBN heterostructures. The encapsulation of hBN prevents b-As0.83P0.17 from oxidization and eliminates surface trap states, therefore the as-fabricated photodetectors work in intrinsic photoconductive mode, and show peak room-temperature extrinsic responsivity of 320, 24.7, and 1.03 mA/W at 3.4, 5.0, and 7.7 μm, respectively. The broadband and high-speed detection at mid-infrared illustrates the potential of b-As0.83P0.17 for optoelectronic applications, such as thermal imaging, biomedical sensing, and free-space mid-infrared communications.

Presenters

  • Shaofan Yuan

    Department of Electrical Engineering, Yale Univ

Authors

  • Shaofan Yuan

    Department of Electrical Engineering, Yale Univ

  • Chenfei Shen

    Univ of Southern California, Mork Family Department of Chemical Engineering and Materials Science, Univeristy of Southern California, Mork Family Department of Chemical Engineering and Materials Science, University of Southern California

  • Bingchen Deng

    Department of Electrical Engineering, Yale University, Department of Electrical Engineering, Yale Univ

  • Xiaolong Chen

    Department of Electrical Engineering, Yale University, Department of Electrical Engineering, Yale Univ

  • Qiushi Guo

    Department of Electrical Engineering, Yale University, Department of Electrical Engineering, Yale Univ

  • Yuqiang Ma

    Ming Hsieh Department of Electrical Engineering, University of Southern California, Univ of Southern California

  • Ahmad Abbass

    Ming Hsieh Department of Electrical Engineering, University of Southern California, Univ of Southern California

  • Bilu Liu

    Ming Hsieh Department of Electrical Engineering, University of Southern California, Univ of Southern California

  • Ralf Haiges

    Univ of Southern California, Loker Hydrocarbon Research Institue and Department of Chemistry, University of Southern California

  • Claudia Ott

    Department of Chemistry, Technical University Munich

  • Tom Nilges

    Department für Chemie, Technische Universität München, Department of Chemistry, Technical University Munich

  • Kenji Watanabe

    National Institute for Materials Science, NIMS, National Institute for Material Science, Advanced Materials Laboratory, National Institute for Materials Science, National Institute of Materials Science, Research Center for Functional Materials, National Institute for Materials Science, National Institute for Materials Science (NIMS, Advanced Materials Laboratory, NIMS, National Institute for Materials Science, Advanced Materials Laboratory, National Institue for Materials Science, National Institute of Material Science, National Institute for Matericals Science, Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Advanced materials laboratory, National institute for Materials Science, NIMS-Japan

  • Takashi Taniguchi

    National Institute for Materials Science, NIMS, National Institute for Material Science, Advanced Materials Laboratory, National Institute for Materials Science, National Institute of Materials Science, Research Center for Functional Materials, National Institute for Materials Science, National Institute for Materials Science (NIMS, Advanced Materials Laboratory, NIMS, National Institute for Materials Science, Advanced Materials Laboratory, National Institue for Materials Science, National Institute of Material Science, National Institute for Matericals Science, Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, NIMS-Japan

  • Ofer Sinai

    Department of Electrical Engineering, Bar-Ilan University, Faculty of Engineering and Bar-Ilan Institute for Nanotechnology and Advanced Materials, Bar-Ilan University

  • Doron Naveh

    Department of Electrical Engineering, Bar-Ilan University, Faculty of Engineering and Bar-Ilan Institute for Nanotechnology and Advanced Materials, Bar-Ilan University

  • Chongwu Zhou

    Department of Electrical Engineering, University of Southern California, Ming Hsieh Department of Electrical Engineering, University of Southern California, Univ of Southern California, Mork Family Department of Chemical Engineering and Materials Science & Ming Hsieh Department of Electrical Engineering, University of Southern California

  • Fengnian Xia

    Department of Electrical Engineering, Yale University, Department of Electrical Engineering, Yale Univ