Structure and Properties Impacting Ferroelectricity in Sn2P2S6
ORAL
Abstract
Sn2P2S6 samples prepare under various conditions including chemical vapor transport and the Bridgman method exhibit marked variations in optical and dielectric properties. To understand the origin of these changes, detailed measurements of the thermal properties by specific heat methods are combined with structural measurements on multiple length scales. We link critical temperature-dependent structural changes with enhanced electronic properties.
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Presenters
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Roger Lalancette
Rutgers University
Authors
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Sizhan Liu
New Jersey Inst of Tech, Department of Physics, New Jersey Inst of Tech
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Han Zhang
New Jersey Inst of Tech, Department of Physics, New Jersey Inst of Tech
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Sanjit Ghose
Photon Science Division, Brookhaven National Laboratory, Brookhaven National Laboratory
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Dean Evans
Air Force Research Laboratory, Wright-Patterson Air Force Base, Materials and Manufacturing Directorate, Air Force Research Laboratory
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Roger Lalancette
Rutgers University
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Trevor Tyson
New Jersey Inst of Tech, Department of Physics, New Jersey Inst of Tech