Characterization of XFEL single pulses using single particle imaging: application to PAL-XFEL

XFELs from the SASE lasing process produces single pulses with intrinsic stochastic nature. Thus, understanding the characteristics of each individual X-ray pulse is important for applications exploiting single femtosecond X-ray pulses. Here we introdue that single particle diffraction imaging can provide a straightforward route to characterize the X-ray pulse energy and spatial coherence of each single pulse radiation from XFELs. This straightforward experimental scheme reduces the effort in developing much demanding appratus for an absolute flux measurements, etc. Analysis was made for the data obtained from recently established PAL-XFEL.