Unraveling the Effect of Multiple Defect States in Synthetic Monolayer MoS2 Through Electronic and Optical Probes
ORAL
Abstract
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Presenters
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Pin-Chun Shen
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Electrical Engineering and Computer Science, Massachusetts Institute of Technology
Authors
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Pin-Chun Shen
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Electrical Engineering and Computer Science, Massachusetts Institute of Technology
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Yuxuan Lin
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Electrical Engineering and Computer Science, Massachusetts Institute of Technology
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Xingzhi Wang
Chemistry, Boston University, Boston University
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Xi Ling
Department of Chemistry, Boston University, Chemistry, Boston University, Boston University
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Tomas Palacios
Massachusetts Inst of Tech-MIT, Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology
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Jing Kong
Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Massachusetts Inst of Tech-MIT, EECS, MIT