Gate set tomography on more than two qubits
ORAL
Abstract
Quantum tomography is often deemed impractical for “large” quantum information processors of more than 2 qubits. Quantum process tomography and gate set tomography (GST) can be, and have been, used to probe the behavior of gates on 1-2 qubits, but are rarely applied to 3 or more qubits. This stems in large part from the sheer number of parameters that need to be probed in standard gate tomography: O(16N) for N qubits. We present a framework for intelligently reducing this parameter explosion to poly(N) parameters. Using reduced models that capture physically plausible errors (e.g., few-qubit interactions and Pauli stochastic noise), we show how to perform gate set tomography effectively on larger systems. We present results from applying these methods to processors with 3+ qubits.
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Presenters
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Erik Nielsen
Sandia National Laboratories
Authors
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Erik Nielsen
Sandia National Laboratories
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Robin Blume-Kohout
Sandia National Laboratories, Center for Computing Research, Sandia National Laboratories, Center for Computing Research, Sandia Natl Labs, Center for Computing Research, Sandia National Labs, Sandia Natl Laboratories, Sandia National Labs
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Kevin Young
Sandia National Laboratories, Sandia National Labs
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Mohan Sarovar
Sandia National Laboratories
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Kenneth Rudinger
Center for Computing Research, Sandia National Laboratories, Center for Computing Research, Sandia Natl Labs
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Timothy Proctor
Sandia National Laboratories