Study of Frequency-dependent Properties of SRO Using Terahertz Time-domain Spectroscopy

We studied four SrRuO₃ (SRO) films grown at the same time on different regions of an Al₂O₃ substrate using terahertz time-domain spectroscopy. The frequency-dependent transmittance values, real indices of refraction and imaginary indices of refraction at the THz range were reported. Real and imaginary conductivities were also reported with Drude fitting. The conductivities obtained from the experiment were in good agreement with the Drude model. The frequency-dependent properties of the four samples were found to be different from each other in terms of amplitude.