Observation of quantum transport in protected topological states of SnTe thin films

ORAL

Abstract

Synthesizing high quality thin films of topological insulators (TIs) and topological crystalline insulators (TCIs) is critical to understanding their unique properties and incorporating them in functional electronic devices. Here we report on efforts to characterize the topological states of the TCI SnTe. High quality, single-domain SnTe films are grown on SrTiO3 by molecular beam epitaxy. Measurements of carrier density reveal conduction through both bulk and surface states in SnTe films of various thickness. In the thinnest films (6 nm), bulk conduction is largely suppressed, leaving conduction solely through surface states at the SnTe/SrTiO3 interface. Magnetotransport measurements of the isolated surface states reveal weak antilocalization (WAL) behavior, a signature of two-dimensional topological transport. The WAL is analyzed to understand the nature of the topological transport through the surface states.

Presenters

  • Stephen Albright

    Dept. of Physics, Center for Research on Interface Structures and Phenomena, Yale University

Authors

  • Stephen Albright

    Dept. of Physics, Center for Research on Interface Structures and Phenomena, Yale University

  • Ke Zou

    Yale Univ, Dept. of Applied Physics, Center for Research on Interface Structures and Phenomena, Yale University

  • Subhasish Mandal

    Yale Univ, Dept. of Applied Physics, Center for Research on Interface Structures and Phenomena, Yale University

  • Sohrab Ismail-Beigi

    Yale Univ, Dept. of Applied Physics, Center for Research on Interface Structures and Phenomena, Yale University, Department of Applied Physics, Yale University, Applied Physics, Yale University

  • Fred Walker

    Department of Applied Physics, Yale University, Dept. of Applied Physics, Center for Research on Interface Structures and Phenomena, Yale University

  • Charles Ahn

    Department of Physics, Yale University, Dept. of Applied Physics, Center for Research on Interface Structures and Phenomena, Yale University, Department of Applied Physics, Yale University