Hybridized magnon-phonon excitation in spin Seebeck effect in Bi3-xYxFe5O12 films
ORAL
Abstract
The spin Seebeck effect (SSE) refers to the generation of a spin current in a magnetic material by a temperature gradient. The spin current is detected as an electric voltage via the inverse spin Hall effect in a metal attached to the magnet. Recently we reported that anomalous asymmetric structures appear in the magnetic field dependence of the SSE in Pt/Y3Fe5O12 (YIG) systems when the magnon and phonon dispersion curves of YIG touch, which maximizes the phase space of hybridized magnon-phonon excitation (or magnon polarons) [1-3].
In this talk, we report the effect of the Bi substitution to YIG on the magnon-polaron features in the SSE. We found that the anomaly field as well as the amplitude of the anomaly change by changing the amount of the Bi substitution. We explain the result in terms of the modification of magnon/phonon dispersion relations and the enhanced magnetoelastic interaction by the Bi substitution. Our results demonstrate that the SSE provides a sensitive probe for coupled magnon and phonon dynamics.
[1] T. Kikkawa et al., Phys. Rev. Lett. 117, 207203 (2016).; [2] B. Flebus, K. Shen, T. Kikkawa et al., Phys. Rev. B 95, 144420 (2017).; [3] L. J. Cornelissen, K. Oyanagi, T. Kikkawa et al., Phys. Rev. B 96, 104441 (2017).
In this talk, we report the effect of the Bi substitution to YIG on the magnon-polaron features in the SSE. We found that the anomaly field as well as the amplitude of the anomaly change by changing the amount of the Bi substitution. We explain the result in terms of the modification of magnon/phonon dispersion relations and the enhanced magnetoelastic interaction by the Bi substitution. Our results demonstrate that the SSE provides a sensitive probe for coupled magnon and phonon dynamics.
[1] T. Kikkawa et al., Phys. Rev. Lett. 117, 207203 (2016).; [2] B. Flebus, K. Shen, T. Kikkawa et al., Phys. Rev. B 95, 144420 (2017).; [3] L. J. Cornelissen, K. Oyanagi, T. Kikkawa et al., Phys. Rev. B 96, 104441 (2017).
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Presenters
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Takashi Kikkawa
Tohoku Univ
Authors
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Takashi Kikkawa
Tohoku Univ
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Koichi Oyanagi
Tohoku Univ, Tohoku Univ.
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Tomosato Hioki
Tohoku Univ
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Masahiko Ishida
NEC Corp, IoT Devices Research Laboratories, NEC corporation
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Zhiyong Qiu
Tohoku Univ, Tohoku Univ.
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Rafael Ramos
Tohoku Univ
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Yusuke Hashimoto
Tohoku Univ
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Eiji Saitoh
Tohoku Univ, Advanced Institute for Materials Research, Tohoku University, Tohoku Univ., Institute for Materials Research, Tohoku University