Integration of superconducting NbN thin films with III-Nitride semiconductors

ORAL

Abstract

The superconducting properties of metallic NbN have been known and studied for several decades, but it has been successfully integrated epitaxially with the Gallium Nitride family of wide-bandgap semiconductors only recently. In this work, we report the physical properties of epitaxial NbN integrated with SiC, AlN, and GaN grown by molecular beam epitaxy. We study the crystallinity, surface and interface qualities of the superconductor/semiconductor heterojunctions, and the superconducting properties (critical temperatures of ~16K, coherence lengths of ~10nm, and critical Meissner fields in excess of 35T) of epitaxial NbN. Progress towards the realization of all-epitaxial NbN/Semiconductor heterojunctions, superconductors integrated with nitride transistors, and epitaxial Josephson junctions, all towards establishing a fundamentally new platform for superconducting electronics will be presented.

Presenters

  • John Wright

    Cornell Univ

Authors

  • John Wright

    Cornell Univ

  • Rusen Yan

    Cornell Univ, Cornell University

  • Guru Khalsa

    Cornell University, Cornell Univ

  • Scott Katzer

    Naval Research Laboratory, Electronics Science & Technology Division, US Naval Research Laboratory

  • Neeraj Nepal

    Naval Research Laboratory

  • Brian Downey

    Naval Research Laboratory

  • David Meyer

    Naval Research Laboratory

  • Huili (Grace) Xing

    Cornell Univ

  • Debdeep Jena

    Cornell Univ, Cornell University