Unveiling the electronic dispersions in layered MoS2 by electron energy loss spectroscopy

POSTER

Abstract

Electronic dispersions of free-standing MoS2 layers have been investigated by momentum-resolved electron energy-loss spectroscopy with an improved q resolution. With the fine q resolution and extensive q range, we were able to explore the plasmon dispersion characteristic of 2D collective excitations along the two principal in-plane directions, ΓM and ΓK. Here, we report the q-dependent EELS analysis on the free-standing layered MoS2 thin films from long-wavelength to large-momentum transfer. Also, the E-q map experiments of MoS2 are exhibited. It was found to display the square root of the q dispersion characteristic of the collective excitation of the 2D electron systems, and further unveil an in-plane electronic anisotropy. Furthermore, the STEM-EELS studies show that the predominant excitations at ~8.5, ~23 and ~12 eV arise from the respective resonances of bulk and surface plasmons in aloof mode. Calculations elucidating the q-resolved EELS analysis are also discussed.

Presenters

  • Chien-Ting Wu

    National Nano Device Laboratories

Authors

  • Chien-Ting Wu

    National Nano Device Laboratories

  • Chuan-Yu Wei

    Department of Materials Science and Engineering, National Taiwan University

  • Chin- Wei Tsao

    Department of Materials Science and Engineering, National Taiwan University

  • Cheng-Yen Wen

    Department of Materials Science and Engineering, National Taiwan University

  • Cheng-Hsuan Chen

    Center for Condensed Matter Sciences, National Taiwan University

  • Ming-Wen Chu

    Center for Condensed Matter Sciences, National Taiwan University, National Taiwan University