High-Performance Sub-Micron Channel WSe2 Field-Effect Transistors Prepared Using A Flood-Dike Printing Method

POSTER

Abstract

Printing technology has potential to offer a cost-effective and scalable way to fabricate electronic devices based on two-dimensional transition metal dichalcogenides (TMDCs). However, limited by the registration accuracy and resolution of printing, previously reported printed TMDC field-effect transistors have relatively long channel lengths (13-200 μm), thus suffering low current-driving capabilities (≤ 0.02 μA/μm). Here, we report a “flood-dike” self-aligned printing technique which allows the formation of source/drain metal contacts on TMDC materials with sub-micron channel lengths. This technique involves three steps, including (i) printing gold ink on WSe2 to form the first electrode, (ii) modifying the surface of the first gold electrode with self-assembled monolayer (SAM) to lower its surface tension, and (iii) printing gold ink close to the SAM-treated first electrode with a certain distance. During the third step, the gold ink would firstly spread toward the first electrode and then get stopped by the hydrophobic SAM coating, forming a sub-micron channel. With this printing technique, we have successfully downscaled the channel length to ~750 nm, and achieved enhanced on-state current densities of ~0.64 μA/μm (average) and high on/off current ratios of ~3x105 (average).

Presenters

  • Fanqi Wu

    Department of Materials Science, University of Southern California, Univ of Southern California

Authors

  • Fanqi Wu

    Department of Materials Science, University of Southern California, Univ of Southern California

  • Liang Chen

    Department of Electrical Engineering, University of Southern California, Ming Hsieh Department of Electrical Engineering, University of Southern California, Univ of Southern California

  • Anyi Zhang

    Department of Chemical Engineering, University of Southern California, Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Univ of Southern California

  • Chongwu Zhou

    Department of Electrical Engineering, University of Southern California, Ming Hsieh Department of Electrical Engineering, University of Southern California, Univ of Southern California, Mork Family Department of Chemical Engineering and Materials Science & Ming Hsieh Department of Electrical Engineering, University of Southern California