Impurity Screening by a Graphene Monolayer Under Uniaxial Strain

We examined the static and dynamic shielding of charged impurities by monolayer graphene which is subject to uniaxial strain. The graphene layer is positioned on top of a dielectric and conducting substrate. Results will be presented for the screened impurity potential for a variety of directions in which strain can be applied and for the distance Z₀ of the impurity from the graphene sheet. For dynamic screening, we consider the role played by the underlying bulk plasmons in the conducting substrate.