Fourier Ptychographic Microscopy in the telecommunication wavelength using a femtosecond laser.

We report the succesful implementation of Fourier Ptychographic Microsopy (FPM) in the telecomunication wavelength using an ultrafast, low coherence laser. High resolution with reduced (near) speckle (free) images were obtained using the proposed approach. We also demostrate FPM can be used to image periodic structures through a silicon wafer.