Joseph F. Keithley Award For Advances in Measurement Science Talk: Development of Scanning Probe Instruments and Application to the Graphene 2D Electron System
COFFEE_KLATCH · Invited
Abstract
[1]. J. A. Stroscio, R. M. Feenstra, and A. P. Fein, Phys. Rev. Lett. 57, 2579 (1986).
[2]. R. M. Feenstra, J. A. Stroscio, J. Tersoff, and A. P. Fein, Phys. Rev. Lett. 58, 1192 (1987).
[3]. Y. J. Song, A. F. Otte, V. Shvarts, Z. Zhao, Y. Kuk, S. R. Blankenship, A. Band, F. M. Hess, and J. A. Stroscio, Rev. of Sci. Instr. 81, 121101 (2011).
[4]. Y. J. Song, A. F. Otte, Y. Kuk, Y. Hu, D. B. Torrance, P. N. First, W. A. de Heer, H. Min, S. Adam, M. D. Stiles, A. H. MacDonald, and J. A. Stroscio, Nature 467, 185 (2010).
[5]. F. Ghahari, D. Walkup, C. Gutierrez, J. F. Rodriguez-Nieva, Y. Zhao, J. Wyrick, F. D. Natterer, W. G. Cullen, K. Watanabe, T. Taniguchi, L. S. Levitov, N. B. Zhitenev, and J. A. Stroscio, Science 356, 845 (2017).
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Presenters
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Joseph Stroscio
Center for Nanoscale Science and Technology, NIST, Center for Nanoscale Science and Technology, NIST -Natl Inst of Stds & Tech, NIST -Natl Inst of Stds & Tech, Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, National Institute of Standards and Technology, NIST
Authors
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Joseph Stroscio
Center for Nanoscale Science and Technology, NIST, Center for Nanoscale Science and Technology, NIST -Natl Inst of Stds & Tech, NIST -Natl Inst of Stds & Tech, Center for Nanoscale Science and Technology, National Institue of Standards and Technology, Center for Nanoscale Science and Technology, National Institute of Standards and Technology, NIST