Structural and Electrical Properties of Pulsed Laser Deposited Yttrium Doped Zirconium Oxide Thin Films Stabilization
ORAL
Abstract
Solid oxide fuel cells, or SOFC’s, are electrochemical conversion devices that produce electricity and potentially a strong candidate to produce clean energy for the future. We are attempting to lower the operating temperature of SOFC’s to minimize startup times and mechanical/chemical issues, yet preserve electrical efficiency. This can be achieved by lowering the solid oxide electrolyte resistivity in between the anode and cathode of the SOFC. This electrolyte compound of Yttrium Zirconium Oxide (Y2ZrO5) or known as Yttria Stabilized Zirconia (YSZ), is what causes the electrochemical conversion for the cell, but is also responsible for the operating temperature of the cells from 800–1000 οC. Our research goal is to determine the relationship between the surface structures. This includes roughness, periodicity, and molecular structure. The resistivity changes due to these characteristics are observed. After production of samples by pulse laser deposition, structural characterization is performed using ellipsometry, scanning electron microscopy equipped with an energy dispersive x-ray spectroscopy, and x-ray diffraction. Electrical properties are analyzed by using four-point probe conductivity measurements. Structural versus electrical properties will be discussed.
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Presenters
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William Cockerell
Physics, Seton Hall Univ
Authors
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William Cockerell
Physics, Seton Hall Univ
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Matthew Melfi
Physics, Seton Hall Univ
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Joshua Steier
Physics, Seton Hall Univ
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Rory Vander Valk
Physics, Seton Hall Univ
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Stephen Kelty
Physics, Seton Hall Univ
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Mehmet Sahiner
Physics, Seton Hall Univ