Characterizing electromechanical coupling of dielectric materials for superconducting circuits

ORAL

Abstract

To further improve the coherence time of superconducting qubits, one needs to consider many different sources of loss. Among those, dielectric loss has been studied in depth, and one contributor of this loss can originate from the electromechanical coupling between the superconducting circuit and the dielectric. In my talk, I will present a highly sensitive technique for measuring electromechanical coupling in a material at cryogenic temperatures and in the GHz regime. The measurement is based on RF driving of phonons through electromechanical coupling and optical readout through Brillouin scattering. I will show measurements done on various materials, including the observation of effective piezoelectricity in inversion symmetric materials, and discuss its implications for qubit coherence times.

Presenters

  • Taekwan Yoon

    Yale University

Authors

  • Taekwan Yoon

    Yale University

  • Yiwen Chu

    Yale University, Departments of Applied Physics and Physics, Yale University

  • Prashanta Kharel

    Yale University

  • William Renninger

    University of Rochester

  • Luigi Frunzio

    Yale University, Applied Physics, Yale University, Physics and Applied Physics, Yale University, Applied Physics, Yale Univ, Dept. of Applied Physics, Yale University, Department of Applied Physics, Yale Univ, Yale Univ, Departments of Applied Physics and Physics, Yale University

  • Peter Rakich

    Yale University

  • Robert Schoelkopf

    Yale University, Applied Physics, Yale University, Dept. of Applied Physics, Yale University, Department of Applied Physics, Yale Univ