Control over the ISHE in a platinum film by ionic gating
ORAL
Abstract
We report reversible modulation of the inverse spin Hall effect (ISHE) in Pt achieved through the careful control of Pt thickness and an ionic gating technique. The ISHE converts spin current into charge current, which allows easy detection of spin current and integration of spintronics and electronics. The effect is governed by spin-orbit interaction and is particularly strong in Pt, which has been widely used as the ISHE-based spin current detector. However, the gate tuning of the spin-orbit interaction in metals was considered out of reach because of high carrier density.
We fabricated Pt films, 1.5 nm to 20 nm thick, on top of the YIG ferrimagnetic layer and used spin pumping to inject spin current in the Pt layer. Using the the ionic gel (DEME-TFSI) top gate, the resistance of the Pt film was tuned up to 280%. Such control over the resistance and carrier density in Pt allowed us to gate tune the amplitude of the ISHE over two orders of magnitude—a result that can be used in spin-torque and other spintronics devices that use spin-charge conversion [1].
[1] S. Dushenko, M. Hokazono, M. Shiraishi et al., Tunable inverse spin Hall effect in nanometer-thick platinum films by ionic gating, Nat. Commun. 9, 3118 (2018).
We fabricated Pt films, 1.5 nm to 20 nm thick, on top of the YIG ferrimagnetic layer and used spin pumping to inject spin current in the Pt layer. Using the the ionic gel (DEME-TFSI) top gate, the resistance of the Pt film was tuned up to 280%. Such control over the resistance and carrier density in Pt allowed us to gate tune the amplitude of the ISHE over two orders of magnitude—a result that can be used in spin-torque and other spintronics devices that use spin-charge conversion [1].
[1] S. Dushenko, M. Hokazono, M. Shiraishi et al., Tunable inverse spin Hall effect in nanometer-thick platinum films by ionic gating, Nat. Commun. 9, 3118 (2018).
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Presenters
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Sergey Dushenko
Kyoto University, University of Maryland, College Park/National Institute of Standards and Technology
Authors
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Sergey Dushenko
Kyoto University, University of Maryland, College Park/National Institute of Standards and Technology
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Masaya Hokazono
Department of Electronic Science and Engineering, Kyoto University
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Kohji Nakamura
Department of Physics Engineering, Mie University
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Teruya Shinjo
Department of Electronic Science and Engineering, Kyoto University
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Yuichiro Ando
Department of Electronic Science and Engineering, Kyoto University, Kyoto University
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Masashi Shiraishi
Department of Electronic Science and Engineering, Kyoto University, Kyoto University