In situ angle-resolved photoemission spectroscopy measurements of cuprate thin films grown by molecular beam epitaxy

ORAL

Abstract

Utilizing the oxide molecular beam epitaxy (MBE) in situ connected to beam-line angle-resolved photoemission spectroscopy (ARPES) in Stanford Synchrotron Radiation Lightsource (SSRL), high-quality cuprate films grown atomic-layer-by-layer enable measurements of electronic structure tuned by various parameters, such as epitaxial strain and surface termination, which have not been possible before with bulk materials. With the in situ connected scanning tunneling microscopy (STM), we are able to further resolve electronic properties of these films in spatial dimensions. In this talk, the newest results coming from this interconnected system will be presented.

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Presenters

  • Zhuoyu Chen

    Stanford University, GLAM, Stanford University

Authors

  • Zhuoyu Chen

    Stanford University, GLAM, Stanford University

  • Slavko Rebec

    Stanford University, GLAM, Stanford University

  • Tao Jia

    Stanford University, GLAM, Stanford University

  • Makoto Hashimoto

    SLAC, SLAC national accelerator laboratory, SLAC National Accelerator Laboratory, Stanford University, SSRL, SLAC

  • Donghui Lu

    SLAC National Accelerator Laboratory, Stanford University, SLAC national accelerator laboratory, SLAC, SSRL, SLAC, Stanford University, SLAC National Accelerator Laboratory

  • Zhixun Shen

    Stanford University, SLAC National Accelerator Laboratory, SIMES, SLAC National Accelerator Lab, GLAM, Stanford University, Applied physics, Stanford University, Department of Applied Physics, Stanford University

  • Robert G Moore

    Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, SLAC, SIMES, SLAC