Metal-semicoductor contact effects and temperature-dependence of carrier transport in large-grain organic semiconductor thin film transistors
ORAL
Abstract
The pen-writer solution deposition method is used to deposit 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) organic semiconductor thin films and also polymer dielectric layers. Organic transistors with source/drain contact layers either below or on top of the semiconductor layer and with or without surface treatment are investigated. Contact resistance produces a pronounced non-linearity in the output characteristics at low drain voltage, which is found to be consistent with a Schottky Barrier model. By treating the Au electrode with pentafluorobenzenethiol (PFBT) in a bottom contact geometry, the contact resistance is greatly reduced. An optimized geometry is obtained by using pen-written CytopTM dielectric in a top-gate/bottom-contact structure, which exhibits a near-intrinsic average mobility, up to 9.0 cm2/V-s for C8-BTBT thin films deposited at high writing speed (25mm/s) and deposition on a heated substrate (60°C). We will report temperature-dependent carrier transport results for individual devices with both a top gate (with cytop dielectric) and bottom gate (with silicon dioxide dielectric) to compare results at both interfaces of the same C8-BTBT thin film.
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Presenters
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Jing Wan
Department of Physics and Materials Science Program, University of Vermont
Authors
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Jing Wan
Department of Physics and Materials Science Program, University of Vermont
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Yang Li
Department of Physics and Materials Science Program, University of Vermont, University of Vermont
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Jonatan Hollin
Department of Chemistry, University of Vermont
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Adam Whalley
Department of Chemistry, University of Vermont
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Randall Headrick
Department of Physics and Materials Science Program, University of Vermont, University of Vermont