High temperature RIXS study of charge transfer excitations in cuprates

ORAL

Abstract

Resonant inelastic X-ray scattering (RIXS) is a promising technique to study momentum-resolved electronic excitations in strongly correlated materials. Here we present results of a recent Cu K-edge RIXS study on the archetypal hole-doped cuprate La2-xSrxCuO4 and electron-doped cuprate Nd2-xCexCuO4. Our measurements, which range from low temperature (15 K) to very high temperature (1200 K), indicate distinct spectral weight changes of charge-transfer excitations below ~ 2 eV. We will make a detailed comparison of the temperature dependent charge-transfer excitations in electron- and hole- doped cuprates.

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Presenters

  • Biqiong Yu

    University of Minnesota, School of Physics and Astronomy, University of Minnesota

Authors

  • Biqiong Yu

    University of Minnesota, School of Physics and Astronomy, University of Minnesota

  • Kenji Ishii

    Synchrotron Radiation Research Center, National Institutes for Quantum

  • Shun Asano

    Department of Physics, Tohoku University

  • Masaki Fujita

    Tohoku University, Department of Physics, Tohoku University

  • Diego M Casa

    Advanced Photon Source, Argonne National Laboratory, USA, Argonne National Lab, Argonne National Laboratory, Advanced Photon Source, Argonne National Laboratory

  • Guichuan Yu

    University of Minnesota, Informatics Institute, University of Minnesota, School of Physics and Astronomy, University of Minnesota

  • Martin Greven

    University of Minnesota, School of Physics and Astronomy, University of Minnesota, Physics and Astronomy, University of Minnesota