Electric coupling and long dephasing times of single defect spins in commercial 4H-SiC
ORAL
Abstract
[1] Seo, H. et al. Nat. Commun. 7, 12935 (2016).
[2] Christle, D. et al. Phys. Rev. X. 7, 021046 (2017).
–
Presenters
-
Kevin Miao
University of Chicago
Authors
-
Kevin Miao
University of Chicago
-
Alexandre Bourassa
University of Chicago
-
Christopher P Anderson
University of Chicago
-
Samuel Whiteley
University of Chicago, Institute for Molecular Engineering and Department of Physics, University of Chicago, Institute for Molecular Engineering, University of Chicago
-
Alexander Crook
University of Chicago
-
Samuel L Bayliss
University of Chicago
-
Gary Wolfowicz
University of Chicago, Institute for Molecular Engineering, University of Chicago
-
Peter Udvarhelyi
Hungarian Academy of Sciences
-
Gergo Thiering
Hungarian Academy of Sciences
-
Viktor Ivady
Wigner Research Centre for Physics, Hungarian Academy of Sciences
-
Hiroshi Abe
National Institutes for Quantum and Radiological Science and Technology (QST), National Institutes for Quantum and Radiological Science and Technology
-
Takeshi Ohshima
National Institutes for Quantum and Radiological Science and Technology (QST), National Institutes for Quantum and Radiological Science and Technology
-
Adam Gali
Hungarian Academy of Sciences, Institute for Solid State Physics and Optics, Wigner Research Centre for Physics, Wigner Research Centre for Physics
-
David Awschalom
University of Chicago, Institute for Molecular Engineering, University of Chicago