Critical-Dimension Grazing-Incidence Small Angle X-Ray Scattering: Applications using Soft, Tender and Hard X-Rays
ORAL
Abstract
Here, we will present the latest development and applications of the technique using hard x-rays on line gratings and contact holes. Moreover, the CD-GISAXS approach was extended to study line edge roughness, latent images [2] and lamellae structure of diblock copolymers, taking advantage of the full energy range provided at the advanced light source and more specifically of the chemical sensitivity provided by soft and tender x-rays scattering.
[1] G. Freychet et al. “Critical-dimension grazing incidence small angle x-ray scattering,” Proc. SPIE 10585, 2018.
[2] G. Freychet et al. “Using resonant soft x-ray scattering to image patterns on undeveloped resists,” Proc. SPIE 10809, 2018.
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Presenters
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Guillaume Freychet
Advanced Light Source, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory
Authors
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Guillaume Freychet
Advanced Light Source, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory
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Dinesh Kumar
Computational Research, Lawrence Berkeley National Laboratory, Advanced Light Source, Lawrence Berkeley National Laboratory
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Isvar Cordova
Advanced Light Source, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory
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Ronald J Pandolfi
Advanced Light Source, Lawrence Berkeley National Laboratory
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Patrick Naulleau
Center for X-ray Optics, Lawrence Berkeley National Laboratory, Advanced Light Source, Lawrence Berkeley National Laboratory
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Cheng Wang
Lawrence Berkeley National Laboratory, Advanced Light Source, Lawrence Berkeley National Laboratory, Lawrence Berkeley Natl Lab
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Alexander Hexemer
Advanced Light Source, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Lab, Lawrence Berkeley National Laboratory