Systematic Removal of Self Assembled Monolayers from Au(111) surfaces, investigated via Atomic Force Microscopy and Contact Angle Measurements

POSTER

Abstract

Self-Assembled Monolayers (SAMs) of thiols on Au(111) surface on mica substrates are used in many instances to study various proof of concept devices such as Nanosensors and Nanoelectronics. However, once used, the Au on mica substrate, upon which the SAM layer sits on, is discarded as surface integrity could deteriorate in the cleaning steps. We have used combinations of organic solvents to critically clean and gently remove the SAM surfaces from the Au(111) substrates. Subsequent surfaces were investigated using Atomic Force Microscopy (AFM) and the Contact Angle measurements. Results were compared with Au(111) surface before SAM deposition and after SAM removal. We have used 1-Dodecanethiol as our SAMs on Au(111) surface. AFM was used in intermittent contact mode to image the investigated surfaces. Discussion of the results obtained compared with the existing literature will follow.

Presenters

  • Indrajith Senevirathne

    Lock Haven University of Pennsylvania

Authors

  • Indrajith Senevirathne

    Lock Haven University of Pennsylvania

  • Kelly M Gerrity

    Lock Haven University of Pennsylvania