Quantitative mechanical and electrical assessment by local probe methods of inkjet-printed PEDOT:PSS thin films

ORAL

Abstract

Among the different technologies implied in scalable additive manufacturing inkjet printing is very well-suited for processing polymers. Thin films of PEDOT:PSS on ITO can be prepared by inkjet printing technology. A relatively broad range of thicknesses can be obtained by addition of subsequent polymer layers resembling an additive manufacturing process. The resulting inkjet PEDOT:PSS films are homogeneous as regard both electrical and mechanical properties. In spite of line topography both the Quantitative Nanomechanical Mapping (QNM) and the Conductive-AFM (C-AFM) characterization reveal homogeneous values throughout the polymer surface regardless of the welding zones. The results discussed in this work provide the basis for the application of inkjet printing as deposition method for electrically conducting PEDOT:PSS into large area with mechanical stability.

Presenters

  • Tiberio Ezquerra

    IEM-CSIC, Serrano 121, Madrid 28006, Spain, IEM-CSIC, Serrano 121, 28006 Madrid, Spain

Authors

  • Edgar Gutierrez-Fernandez

    IEM-CSIC, Serrano 121, 28006 Madrid, Spain

  • I.A. Gabaldon-Saucedo

    Departament d’Enginyeria Electrònica i Biomèdica, IN2UB-Universitat de Barcelona, 08028, Barcelona, Spain.

  • M. C. Garcia-Gutierrez

    IEM-CSIC, Serrano 121, 28006 Madrid, Spain

  • A. Varea

    Departament d’Enginyeria Electrònica i Biomèdica, IN2UB-Universitat de Barcelona, 08028, Barcelona, Spain.

  • A. Nogales

    IEM-CSIC, Serrano 121, Madrid 28006, Spain, IEM-CSIC, Serrano 121, 28006 Madrid, Spain

  • E. Rebollar

    IQFR-CSIC, Serrano 119, Madrid 28006, Spain

  • A. Vila

    Departament d’Enginyeria Electrònica i Biomèdica, IN2UB-Universitat de Barcelona, 08028, Barcelona, Spain.

  • A. Cirera

    Departament d’Enginyeria Electrònica i Biomèdica, IN2UB-Universitat de Barcelona, 08028, Barcelona, Spain.

  • Tiberio Ezquerra

    IEM-CSIC, Serrano 121, Madrid 28006, Spain, IEM-CSIC, Serrano 121, 28006 Madrid, Spain