Stacking-dependent interlayer phonons in 3R and 2H MoS2

ORAL

Abstract

Atomically thin MoS2, a prototype two-dimensional semiconductor, commonly exhibits the 2H stacking order. In even layer numbers, 2H MoS2 restores the inversion symmetry and hence loses many attractive properties, such as second harmonic generation, piezoelectricity and spin-valley coupling.But researchers have recently grown MoS2 crystals with 3R stacking order, which in all layer numbers breaks the inversion symmetry and retains the valleytronic, piezoelectric and nonlinear optical properties as in the monolayer.
We have directly probed the stacking-dependent interlayer coupling in the pure 2H and 3R structure of MoS2 by ultralow-frequency Raman spectroscopy. We observe up to three shear branches and four breathing branches in MoS2 samples with thickness from 2 to 13 layers. Our results show distinct behavior of the shear modes between 2H and 3R MoS2, and also suggest a slightly enhanced interlayer coupling in 2H MoS2 compared to 3R MoS2. Through a combination first-principles calculations, group theory, and an effective bond-polarizability model, we account for all the major observations in our experiment.

Presenters

  • Jeremiah Van Baren

    Department of Physics and Astronomy, University of California, Riverside

Authors

  • Jeremiah Van Baren

    Department of Physics and Astronomy, University of California, Riverside

  • Gaihua Ye

    Texas Tech University, Department of Electrical and Computer Engineering, Texas Tech University

  • Zhipeng Ye

    Texas Tech University, Department of Electrical and Computer Engineering, Texas Tech University

  • Pouyan Rezaie

    Department of Electrical and Computer Engineering, Texas Tech University, Texas Tech University

  • Jia-An Yan

    Department of Physics, Astronomy, and Geosciences, Towson University, Department of Physics, Astronomy, and Geosciences, Towson University, 8000 York Road, Towson, MD 21252, USA., Towson University, Towson University

  • Yu Peng

    NTU, Centre for Programmed Materials, School of Materials Science and Engineering, Nanyang Technological University

  • Zheng Liu

    NTU, Nanyang Technological University, Centre for Programmed Materials, School of Materials Science and Engineering, Nanyang Technological University

  • Rui He

    Texas Tech University, Department of Electrical and Computer Engineering, Texas Tech University

  • Chun Hung Lui

    Department of Physics and Astronomy, University of California, Riverside, University of California, Riverside