Measurement of Helical Edge States in Ultra-thin LaTiO3/SrTiO3 Heterostructures

ORAL

Abstract

Emergent metallic behavior at the interface of the Mott insulator LaTiO3 and the band insulator SrTiO3 has been explained in terms of charge redistribution at the interface combined with strain-induced electronic structure modification. We have previously studied ultra-thin (3 unit cell thick) films of LaTiO3 on SrTiO3 substrates and found evidence for unexpectedly large spin-orbit coupling from quantum oscillations with an associated Berry phase, weak anti-localization in the magnetoresistance, and anisotropic in-plane magnetoresistance. In order to tune this material, we have electrically gated these films both on the back side of the SrTiO3 substrate and on top of the LaTiO3 film with an electrolytic gate. Most interestingly, we found a maximum in the resistance that is quantized to the quantum of conductance (2e2/h). This is independent of the dimensions of the sample. Additionally, by studying samples with four and six contact geometries, we measure nonlocal transport similar. These features are present up to a surprisingly high temperature of 230K. We attribute these observations to helical edge states at the LaTiO3/SrTiO3 interface.

Presenters

  • Michael Veit

    Stanford University

Authors

  • Michael Veit

    Stanford University

  • Di Yi

    Stanford University

  • Remi Arras

    University of Toulouse

  • Rossitza Pentcheva

    University of Duisburg-Essen

  • Yuri Suzuki

    Stanford University, Department of Applied Physics, Stanford University, Applied Physics, Stanford University, Geballe Laboratory for Advanced Materials, Stanford University